Characterization of Semiconductors by Photoluminescence using Microspectroscopy

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Photoluminescence (PL) is a powerful tool for semiconductor characterization in the various stages in its life cycle. That includes development, testing, quality control, and failure analysis.

PL is entirely a photon, mediated process, so it is a non-contact and non-destructive method of probing materials. Therefore, manufacturers can integrate PL into the production process without destroying or contaminating the tested sample

Download our free e-book on Characterization of Semiconductors by Photoluminescence using Microspectroscopy.

Learn more about how to expand the research capabilities on your microscope simply by adding a light source, a detector, a camera or a spectrometer.  

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Characterization of Semiconductors by Photoluminescence using Microspectroscopy
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